IoT and Embedded Device Testing

As IoT and embedded devices become the backbone of smart homes, industries, and connected ecosystems, testing and securing these systems has never been more critical. This session focuses on practical strategies and frameworks for validating the performance, security, and interoperability of IoT-enabled embedded systems, from sensors and gateways to cloud and AI-driven applications.

Participants will explore end-to-end testing workflows that ensure robust connectivity, reliable device operation, and secure data management, with insights from MosChip’s cross-functional expertise spanning hardware, firmware, digital platforms, and AI integration.

Key Topics:

• Testing across IoT architecture: sensors, edge devices, gateways, and cloud
• Embedded firmware validation (RTOS, protocols, connectivity stacks)
• IoT network testing: Wi-Fi, BLE, Zigbee, Matter, and LPWANs
• Security and vulnerability testing (VAPT, intrusion detection, DevSecOps)
• OTA update and device lifecycle validation
• AI and analytics integration testing for predictive maintenance and automation
• Test automation frameworks and dashboards for real-time monitoring
• Interoperability and compliance testing for large-scale IoT deployments

Takeaway:
Discover how to accelerate your IoT and embedded product testing lifecycle using AI-assisted automation, secure-by-design methodologies, and cross-domain validation frameworks that connect devices to the cloud, efficiently and intelligently.